%0 conference poster
%@ 
%A Boehm, J.,Wanner, a.,Kampmann, R.,Franz, H.,Liss, K.-D.,Schreyer, A.,Clemens, H.

%D 2002
%J E-MRS Spring Meeting 2002, Symposium
%N 
%P  

%T Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance
%U 
 
%X