%0 conference lecture
%@ 
%A Jacobi, S.,Wiesmann, J.,Steeg, B.,Stoermer, M.,Feldhaus, J.,Michaelsen, C.
%D 2002
%J Spie´s Annual Meeting, Spie´s International Symposium on Optical Science and Technology
%N 
%P  

%T Characterization of carbon films as total-reflection mirrors for XUV Free Electron Lasers
%U 
 
%X