%0 conference object
%@ 
%A Schwenke, H.,Beaven, P.,Knoth, J.

%D 2000
%J 7. International Symposium on Particles on Surfaces: Detection, Adhesion and Removal
%N 
%P  

%T Total Reflection and Grazing Emission X-ray Fluorescence Spectrometry: Assessment of the size of contaminant particles on silicon wafer surfaces
%U 
 
%X