%0 journal article
%@ 0034-6748
%A Wiener, G.,Michaelsen, C.,Knoth, J.,Schwenke, H.,Bormann, R.

%D 1995
%J Review of Scientific Instruments
%N 1
%P 20-23 

%T Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques
%U 
1 
%X