%0 journal article
%@ 0584-8547
%A Wiener, G.,Guenther, R.,Michaelsen, C.,Knoth, J.,Schwenke, H.,Bormann, R.

%D 1997
%J Spectrochimica Acta  B
%N 
%P 813-821 

%T Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry
%U 
 
%X