%0 journal article,GKSS report
%@ 0947-8396
%A Weisbrod, U.,Gutschke, R.,Knoth, J.,Schwenke, H.

%D 1991
%J Applied Physics  A
%N 
%P 449-456 

%T Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis
%U 
 
%X