%0 journal article,GKSS report
%@ 0947-8396
%A Schwenke, H.,Gutschke, R.,Knoth, J.,Kock, M.

%D 1992
%J Applied Physics  A
%N 
%P 460-465 

%T Treatment of roughness and concentration gradients in total reflection X-ray fluorescence analysis of surfaces
%U 
 
%X