@misc{wirtensohn_nanoscale_darkfield_2024, 
author={Wirtensohn, S.,Qi, P.,David, C.,Herzen, J.,Greving, I.,Flenner, S.},
title={Nanoscale dark-field imaging in full-field transmission X-ray microscopy},
year={2024},
howpublished = {journal article},
doi = {https://doi.org/10.1364/OPTICA.524812},
abstract = {The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright field by motorized apertures in the back focal plane of the objective lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale.},
note = {Online available at: \url{https://doi.org/10.1364/OPTICA.524812} (DOI). Wirtensohn, S.; Qi, P.; David, C.; Herzen, J.; Greving, I.; Flenner, S.: Nanoscale dark-field imaging in full-field transmission X-ray microscopy. Optica. 2024. vol. 11, no. 6, 852-859. DOI: 10.1364/OPTICA.524812}}