@misc{joseph_metadata_schema_2021, 
author={Joseph, R.,Chauhan, A.,Eschke, C.,Ihsan, A.Z.,Jalali, M.,Jäntsch, U.,Jung, N.,Shyam Kumar, C.N.,Kübel, C.,Lucas, C.,Mail, M.,Mazilkin, A.,Neidiger, C.,Panighel, M.,Sandfeld, S.,Stotzka, R.,Thelen, R.,Aversa, R.},
title={Metadata schema to support FAIR data in scanning electron microscopy},
year={2021},
howpublished = {conference paper: Virtual; 26.10.2021 - 29.10.2021},
abstract = {The development and the adoption of metadata schemas and standards are a key aspect in data management. In this paper, we introduce our approach to a metadata model in the field of Materials Science. We present the specific use case of a metadata schema for Scanning Electron Microscopy, a characterization technique which is routinely used in Materials Science. This metadata schema is aiming to be a de-facto standard which will be openly available for reuse and further extension to other electron microscopy techniques. Copyright © 2021 for this paper by its authors.},
note = {Online available at: \url{} (DOI). Joseph, R.; Chauhan, A.; Eschke, C.; Ihsan, A.; Jalali, M.; Jäntsch, U.; Jung, N.; Shyam Kumar, C.; Kübel, C.; Lucas, C.; Mail, M.; Mazilkin, A.; Neidiger, C.; Panighel, M.; Sandfeld, S.; Stotzka, R.; Thelen, R.; Aversa, R.: Metadata schema to support FAIR data in scanning electron microscopy. In: Pozanenko A.; Stupnikov S.; Thalheim B.; Mendez E.; Kiselyova N. (Ed.): CEUR Workshop Proceedings : Supplementary 23rd International Conference on Data Analytics and Management in Data Intensive Domains, DAMDID/RCDL 2021. Virtual. CEUR-WS. 2021. 265-277.}}