@misc{staron_depthresolved_residual_2014, 
author={Staron, P.,Fischer, T.,Keckes, J.,Schratter, S.,Hatzenbichler, T.,Schell, N.,Mueller, M.,Schreyer, A.},
title={Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell},
year={2014},
howpublished = {journal article},
doi = {https://doi.org/10.4028/www.scientific.net/MSF.768-769.72},
abstract = {A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.},
note = {Online available at: \url{https://doi.org/10.4028/www.scientific.net/MSF.768-769.72} (DOI). Staron, P.; Fischer, T.; Keckes, J.; Schratter, S.; Hatzenbichler, T.; Schell, N.; Mueller, M.; Schreyer, A.: Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell. Materials Science Forum, International Conference on Residual Stresses 9. 2014. vol. 768-769, 72-75. DOI: 10.4028/www.scientific.net/MSF.768-769.72}}