@misc{staron_depthresolved_residual_2012, 
author={Staron, P.,Fischer, T.,Keckes, J.,Schratter, S.,Hatzenbichler, T.,Schell, N.,Mueller, M.,Schreyer, A.},
title={Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell},
year={2012},
howpublished = {conference lecture: Garmisch-Partenkirchen (D); 07.-12.10.2012},
note = {Online available at: \url{} (DOI). Staron, P.; Fischer, T.; Keckes, J.; Schratter, S.; Hatzenbichler, T.; Schell, N.; Mueller, M.; Schreyer, A.: Depth-resolved residual stress analysis with high-energy synchrotron X-rays using a conical slit cell. International Conference on Residual Stress, ICRS-9. Garmisch-Partenkirchen (D), 2012.}}