@misc{herzen_xray_grating_2011, 
author={Herzen, J.,Donath, T.,Beckmann, F.,Ogurreck, M.,David, C.,Mohr, J.,Pfeiffer, F.,Schreyer, A.},
title={X-ray grating interferometer for materials-science imaging at a low-coherent wiggler source},
year={2011},
howpublished = {journal article},
doi = {https://doi.org/10.1063/1.3662411},
abstract = {X-ray phase-contrast radiography and tomography enable to increase contrast for weakly absorbing materials. Recently, x-ray grating interferometers were developed that extend the possibility of phase-contrast imaging from highly brilliant radiation sources like third-generation synchrotron sources to non-coherent conventional x-ray tube sources. Here, we present the first installation of a three grating x-ray interferometer at a low-coherence wiggler source at the beamline W2 (HARWI II) operated by the Helmholtz-Zentrum Geesthacht at the second-generation synchrotron storage ring DORIS (DESY, Hamburg, Germany). Using this type of the wiggler insertion device with a millimeter-sized source allows monochromatic phase-contrast imaging of centimeter sized objects with high photon flux. Thus, biological and materials-science imaging applications can highly profit from this imaging modality. The specially designed grating interferometer currently works in the photon energy range from 22 to 30 keV, and the range will be increased by using adapted x-ray optical gratings. Our results of an energy-dependent visibility measurement in comparison to corresponding simulations demonstrate the performance of the new setup.},
note = {Online available at: \url{https://doi.org/10.1063/1.3662411} (DOI). Herzen, J.; Donath, T.; Beckmann, F.; Ogurreck, M.; David, C.; Mohr, J.; Pfeiffer, F.; Schreyer, A.: X-ray grating interferometer for materials-science imaging at a low-coherent wiggler source. Review of Scientific Instruments. 2011. vol. 82, no. 11, 113711. DOI: 10.1063/1.3662411}}