@misc{kostov_fast_in_2012, 
author={Kostov, V.,Gibmeier, J.,Wilde, F.,Staron, P.,Roessler, R.,Wanner, A.},
title={Fast in situ phase and stress analysis during laser surface treatment: A synchrotron x-ray diffraction approach},
year={2012},
howpublished = {journal article},
doi = {https://doi.org/10.1063/1.4764532},
abstract = {An in situ stress analysis by means of synchrotron x-ray diffraction was carried out during laser surface hardening of steel. A single exposure set-up that based on a special arrangement of two fast silicon strip line detectors was established, allowing for fast stress analysis according to the sin2ψ x-ray analysis method. For the in situ experiments a process chamber was designed and manufactured, which is described in detail. First measurements were carried out at the HZG undulator imaging beamline (IBL, beamline P05) at the synchrotron storage ring PETRA III, DESY, Hamburg (Germany). The laser processing was carried out using a 6 kW high power diode laser system. Two different laser optics were compared, a Gaussian optic with a focus spot of ø 3 mm and a homogenizing optic with a rectangular spot dimension of 8 × 8 mm2. The laser processing was carried out using spot hardening at a heating-/cooling rate of 1000 K/s and was controlled via pyrometric temperature measurement using a control temperature of 1150 °C. The set-up being established during the measuring campaign allowed for this first realization data collection rates of 10Hz. The data evaluation procedure applied enables the separation of thermal from elastic strains and gains unprecedented insight into the laser hardening process.},
note = {Online available at: \url{https://doi.org/10.1063/1.4764532} (DOI). Kostov, V.; Gibmeier, J.; Wilde, F.; Staron, P.; Roessler, R.; Wanner, A.: Fast in situ phase and stress analysis during laser surface treatment: A synchrotron x-ray diffraction approach. Review of Scientific Instruments. 2012. vol. 83, no. 11, 115101. DOI: 10.1063/1.4764532}}