@misc{cihelka_optical_emission_2009, 
author={Cihelka, J.,Juha, L.,Chalupsky, J.,Rosmej, F.B.,Renner, O.,Saksl, K.,Hajkova, V.,Vysin, L.,Galtier, E.,Schott, R.,Khorsand, A.R.,Riley, D.,Dzelzainis, T.,Nelson, A.,Lee, R.W.,Heimann, P.,Nagler, B.,Vinko, S.,Wark, J.,Whitcher, T.,Toleikis, S.,Tschentscher, T.,Faustlin, R.,Wabnitz, H.,Bajt, S.,Chapman, H.,Krzywinski, J.,Sobierajski, R.,Klinger, D.,Jurek, M.,Pelka, J.,Hau-Riege, S.,London, R.A.,Kuba, J.,Stojanovic, N.,Sokolowski-Tinten, K.,Gleeson, A.J.,Stoermer, M.,Andreasson, J.,Hajdu, J.,Iwan, B.,Timneanu, N.},
title={Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser},
year={2009},
howpublished = {conference paper: Prag  (CZ); 21.-23.04.2009},
doi = {https://doi.org/10.1117/12.822766},
note = {Online available at: \url{https://doi.org/10.1117/12.822766} (DOI). Cihelka, J.; Juha, L.; Chalupsky, J.; Rosmej, F.; Renner, O.; Saksl, K.; Hajkova, V.; Vysin, L.; Galtier, E.; Schott, R.; Khorsand, A.; Riley, D.; Dzelzainis, T.; Nelson, A.; Lee, R.; Heimann, P.; Nagler, B.; Vinko, S.; Wark, J.; Whitcher, T.; Toleikis, S.; Tschentscher, T.; Faustlin, R.; Wabnitz, H.; Bajt, S.; Chapman, H.; Krzywinski, J.; Sobierajski, R.; Klinger, D.; Jurek, M.; Pelka, J.; Hau-Riege, S.; London, R.; Kuba, J.; Stojanovic, N.; Sokolowski-Tinten, K.; Gleeson, A.; Stoermer, M.; Andreasson, J.; Hajdu, J.; Iwan, B.; Timneanu, N.: Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser. In: Juha, L.; Bajt, S.; Sobierajski, R. (Ed.): Proceedings of SPIE, International Conference on Damage to VUV, EUV, and X-Ray Optics II. Prag  (CZ). 2009. 73610P. DOI: 10.1117/12.822766}}