@misc{schroer_fullfield_and_2006, 
author={Schroer, C.G.,Kuhlmann, M.,Guenzler, T.F.,Benner, B.,Kurapova, C.,Patommel, J.,Lengeler, B.,Roth, S.V.,Gehrke, R.,Snigirev, A.,Snigireva, I.,Almendarez-Camarillo, A.,Beckmann, F.},
title={Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses},
year={2006},
howpublished = {conference paper: San Diego, CA (USA); 15.-17.08.2006},
note = {Online available at: \url{} (DOI). Schroer, C.; Kuhlmann, M.; Guenzler, T.; Benner, B.; Kurapova, C.; Patommel, J.; Lengeler, B.; Roth, S.; Gehrke, R.; Snigirev, A.; Snigireva, I.; Almendarez-Camarillo, A.; Beckmann, F.: Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses. In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006. San Diego, CA (USA). 2006. 63181H.}}