@misc{boehm_internal_stress_2002, 
author={Boehm, J.,Wanner, a.,Kampmann, R.,Franz, H.,Liss, K.-D.,Schreyer, A.,Clemens, H.},
title={Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance},
year={2002},
howpublished = {conference poster: Strasbourg (F); 18.-21.06.2002},
note = {Online available at: \url{} (DOI). Boehm, J.; Wanner, a.; Kampmann, R.; Franz, H.; Liss, K.; Schreyer, A.; Clemens, H.: Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance. In: E-MRS Spring Meeting 2002, Symposium. Strasbourg (F). 2002.}}