@misc{barmak_exsitu_characterization_1999, 
author={Barmak, K.,Rickman, J. M.,Michaelsen, C.,Ristau, R. A.,Kim, J.,Lucadamo, G.,Carpenter, D. T.,Tong, W. S.},
title={Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films},
year={1999},
howpublished = {journal article},
note = {Online available at: \url{} (DOI). Barmak, K.; Rickman, J.; Michaelsen, C.; Ristau, R.; Kim, J.; Lucadamo, G.; Carpenter, D.; Tong, W.: Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films. Journal of Vacuum Science and Technology  A. 1999. vol. 17, 1950-1957.}}