@misc{schwenke_determination_of_1988, 
author={Schwenke, H.,Knoth, J.,Weisbrod, U.},
title={Determination of metallic impurities in the surface of silicon wafers by total reflection x-ray fluorescence analysis},
year={1988},
howpublished = {conference lecture: New Orleans, LA (USA); 22.-26.02.1988},
note = {Online available at: \url{} (DOI). Schwenke, H.; Knoth, J.; Weisbrod, U.: Determination of metallic impurities in the surface of silicon wafers by total reflection x-ray fluorescence analysis. The Pittsburgh Conference + Exposition. New Orleans, LA (USA), 1988.}}