@misc{schwenke_depth_profiling_1997, 
author={Schwenke, H.,Beaven, P.,Knoth, J.},
title={Depth profiling in the uppermost surface zones using total reflection X-ray fluorescence spectrometry},
year={1997},
howpublished = {conference lecture: Lisbon (P); October 6-9, 1997},
note = {Online available at: \url{} (DOI). Schwenke, H.; Beaven, P.; Knoth, J.: Depth profiling in the uppermost surface zones using total reflection X-ray fluorescence spectrometry. International Workshop on Nanometer-scale Methods in X-ray Technology. Lisbon (P), 1997.}}