@misc{wiener_ion_beam_1997, 
author={Wiener, G.,Guenther, R.,Michaelsen, C.,Knoth, J.,Schwenke, H.,Bormann, R.},
title={Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry},
year={1997},
howpublished = {journal article},
note = {Online available at: \url{} (DOI). Wiener, G.; Guenther, R.; Michaelsen, C.; Knoth, J.; Schwenke, H.; Bormann, R.: Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry. Spectrochimica Acta  B. 1997. vol. 52, 813-821.}}