@misc{schwenke_depth_profiling_1997, 
author={Schwenke, H.,Knoth, J.,Guenther, R.,Wiener, G.,Bormann, R.},
title={Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering},
year={1997},
howpublished = {journal article},
note = {Online available at: \url{} (DOI). Schwenke, H.; Knoth, J.; Guenther, R.; Wiener, G.; Bormann, R.: Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering. Spectrochimica Acta  B. 1997. vol. 52, 795-803.}}