%0 conference paper
%@ 
%A Schuster, M., Goebel, H., Bruegemann, L., Bahr, D., Burgaezy, F., Michaelsen, C., Stoermer,  M., Ricardo, P., Dietsch, R., Holz, T., Mai, H.

%D 1999
%J SPIE, EUV, X-Ray, and Neutron Optics and Sources

%P 183-198 

%T Laterally graded multilayer optics for x-ray analysis
%U 
 
%X